Alieva, T. Et Al. 2000. A nondestructive method for measuring thermal parameters of hermetically sealed electron devices. Instruments and Experimental Techniques , vol.43, no.1 , 143-144.

Alieva, T., Axundova, N., & Abdinov, D., (2000). A nondestructive method for measuring thermal parameters of hermetically sealed electron devices. Instruments and Experimental Techniques , vol.43, no.1, 143-144.

Alieva, T.D., Nailə Axundova, And D.Sh. Abdinov. "A nondestructive method for measuring thermal parameters of hermetically sealed electron devices," Instruments and Experimental Techniques , vol.43, no.1, 143-144, 2000

Alieva, T.D. Et Al. "A nondestructive method for measuring thermal parameters of hermetically sealed electron devices." Instruments and Experimental Techniques , vol.43, no.1, pp.143-144, 2000

Alieva, T. Axundova, N. And Abdinov, D. (2000) . "A nondestructive method for measuring thermal parameters of hermetically sealed electron devices." Instruments and Experimental Techniques , vol.43, no.1, pp.143-144.

@article{article, author={T.D. Alieva Et Al. }, title={A nondestructive method for measuring thermal parameters of hermetically sealed electron devices}, journal={Instruments and Experimental Techniques}, year=2000, pages={143-144} }