Study of the physical nature of Mn4Si7 crystals formed by the diffusion method using an X-ray diffraction

Igamov B., Kamardin A., Nabiev D., Bekpulatov I., Imanova G., Kamilov T., ...daha çox

Journal of Crystal Growth, vol.649, 2025 (SCI-Expanded, Scopus) identifier

  • Nəşrin Növü: Article / Article
  • Cild: 649
  • Nəşr tarixi: 2025
  • Doi nömrəsi: 10.1016/j.jcrysgro.2024.127932
  • jurnalın adı: Journal of Crystal Growth
  • Jurnalın baxıldığı indekslər: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Chemical Abstracts Core, Chimica, Compendex, INSPEC
  • Açar sözlər: Agglomeration, Amorphism, Crystallization, Dislocation density, Lattice tension, Nonstoichiometry
  • Açıq Arxiv Kolleksiyası: Məqalə
  • Adres: Yox

Qısa məlumat

Mn4Si7 silicide crystals obtained by the diffusion method were studied using an X-ray diffractometer (XRD-6100) SHIMADZU. As a result of research, 14 peaks were identified in the Mn4Si7 crystal, corresponding to the database (COD-1530134).The size of Mn4Si7 silicide crystals (DDiff) ranged from 6.2 × 10−10 m to 9.1 × 10−8 m, the lattice tension between crystal atoms (εDiff) from 0.31 to 3.71, the dislocation density on the surface (δDiff) varied in the range from 1 × 1011 to 3.2 × 1014. It was found that the degree of crystallization of Mn4Si7 was 9.3 %, and the degree of amorphism reached 90.7 %. It has been established that the degree of crystallization of Mn4Si7 silicides is relatively low due to the fact that the Mn and Si atoms are non-stoichiometrically bonded to each other, and the degree of amorphism is high.