Akademik Məlumat İdarəetmə Sistemi
Physica Status Solidi (C) Current Topics in Solid State Physics, vol.12, no.6, pp.592-595, 2015 (Scopus)
Cadmium sulfide thin films on soda lime substrates were obtained by rf-magnetron sputtering in argon-oxygen atmosphere. As-prepared and vacuum annealed films were then studied by spectroscopic ellipsometry at room temperature over photon energy range from 0.5 to 6 eV. The obtained ellipsometric data were treated using optical dispersion models based on Gaussian type oscillators. Dielectric function of oxygen-free films, as well as those obtained under 3% of O/Ar partial pressure was reliably restored. At the same time, dielectric function obtained for 5% CdS:O can be regarded only as an average over several materials since our XPS examination disclosed presence of several compounds in thin films deposited at O/Ar ratios higher than 3%.