Phase-modulated spectroscopic ellipsometry and polarized transmission intensity studies of wide-gap biaxial CaGa2S4

Shim Y., MƏMMƏDOV N., Yamamoto N.

The 3rd International Conference on Spectroscopic Ellipsometry, Vienna, Austria, 6 - 11 July 2003, vol.455-456, pp.244-247, (Full Text) identifier

  • Nəşrin Növü: Conference Paper / Full Text
  • Cild: 455-456
  • Doi nömrəsi: 10.1016/j.tsf.2004.01.010
  • Çap olunduğu şəhər: Vienna
  • Ölkə: Austria
  • Səhifə sayı: pp.244-247
  • Açar sözlər: Biaxial materials, CaGa2S4, Dielectric function, Refractive index, Spectroscopic phase modulated ellipsometry
  • Açıq Arxiv Kolleksiyası: Konfrans Materialı
  • Adres: Bəli

Qısa məlumat

Differently prepared natural (100)-oriented cleavage planes of the orthorhombic wide-gap (Eo ∼ 4.1 eV) single crystalline CaGa 2S4 were examined in two symmetric positions at room temperature over the photon energies 0.8-6.5 eV by spectroscopic ellipsometry. Complimentary, polarized transmission intensity technique was applied. The data obtained by both techniques were further treated within standard biaxial approach and the major refraction indices were restored for the practically important range below energy gap. The structure and polarization peculiarities of the obtained pseudo-dielectric function were related with apparently four critical points of interband electronic transitions in ZZ (E1=4.49 eV, E3=5.34 eV) and YY (E2=5.00 eV, E4=6.21 eV) configurations, respectively. © 2004 Elsevier B.V. All rights reserved.