Incoherent ellipsometry below energy gap of TlInS2

Shim Y., Okada W., MƏMMƏDOV N.

Thin Solid Films, vol.509, no.1-2, pp.137-140, 2006 (SCI-Expanded, Scopus) identifier

  • Nəşrin Növü: Article / Article
  • Cild: 509 Say: 1-2
  • Nəşr tarixi: 2006
  • Doi nömrəsi: 10.1016/j.tsf.2005.09.042
  • jurnalın adı: Thin Solid Films
  • Jurnalın baxıldığı indekslər: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Səhifə sayı: pp.137-140
  • Açar sözlər: Ellipsometry, Layered material, Optical anisotropy, Refractive index, TlInS2
  • Açıq Arxiv Kolleksiyası: Məqalə
  • Adres: Bəli

Qısa məlumat

The layered material TlInS2 was studied by spectroscopic phase modulated ellipsometry in the energy range 0.75-2.00 eV at room temperature. By using an incoherent reflection model and assuming that optic axis (c*) of TlInS2 is normal to the layer plane, the refractive indices in E // c* and E ⊥ c* orientations of the electrical vector, E, of the incident light were obtained for a region of photon energies below the energy gap of this material. A remarkable increase of the birefringence at photon energies approaching energy gap (2.4 eV) was observed to be a good illustration of the fact that band gap exciton transitions in TlInS2 at room temperature are allowed in E // c* and forbidden in E ⊥ c* orientation, respectively. It is shown that biaxial effects in TlInS2 are small and sample-dependent. © 2005 Elsevier B.V. All rights reserved.