Optical Properties of Magnetic Semiconductors TlFeS2 and TlFeSe2


Badalova Z., Cahangirli Z., Abdullayev Y. A., Ragimov S., MEHDİYEV B., Hidiyev K. A., ...daha çox

Physics of the Solid State, vol.67, no.6, pp.469-477, 2025 (SCI-Expanded, Scopus) identifier

  • Nəşrin Növü: Article / Article
  • Cild: 67 Say: 6
  • Nəşr tarixi: 2025
  • Doi nömrəsi: 10.1134/s106378342560116x
  • jurnalın adı: Physics of the Solid State
  • Jurnalın baxıldığı indekslər: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Chemical Abstracts Core, INSPEC
  • Səhifə sayı: pp.469-477
  • Açar sözlər: band structure, dielectric function, extinction coefficient, reflection coefficient, refractive index, spectral ellipsometry, Urbach energy
  • Açıq Arxiv Kolleksiyası: Məqalə
  • Adres: Bəli

Qısa məlumat

Abstract: The spectral dependences of the optical conductivity and reflection coefficients of TlFeS2 and TlFeSe2 crystals were studied experimentally using spectral ellipsometry and theoretically from first principles using density functional theory (DFT). Based on ellipsometric data in the energy range of 0.7–6.5 eV, the widths of the indirect band gap Eg, reflection coefficients R, Urbach energy EU, skin depth, and other parameters were determined. Analysis of the refractive index spectrum using the single-effective-oscillator model yielded estimates of the single oscillator energy Eso and the dispersion energy Ed. The experimental data were also used to determine the plasma frequency and the ratio of the charge carrier concentration to the effective mass. Furthermore, the nonlinear refractive indices and the first- and third-order nonlinear susceptibilities were calculated.