RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY, vol.82, pp.1967-1968, 2008 (SCI-Expanded)
The effect of annealing of Pb1 - x Mn x Te crystals at ∼690 K and structures on their basis at ∼383 K on the adhesive and electric properties of the interface in the Pb1 - x Mn x Te-(In-Ag-Au) structure was studied over the temperature range ∼77-300 K. The contacts possessed high adhesive strength. The effect of annealing on contact resistance r c was determined by a change in the specific resistance of crystals, diffusion of Ag atoms into the near-contact area of crystals, and the formation of intermediate phases of the Ag2Te type at the interface.