Structural and Optical Properties of PEDOT: PSS

Emdadi B., Asimov A.

Integrated Ferroelectrics, vol.237, no.1, pp.125-132, 2023 (SCI-Expanded, Scopus) identifier identifier

  • Nəşrin Növü: Article / Article
  • Cild: 237 Say: 1
  • Nəşr tarixi: 2023
  • Doi nömrəsi: 10.1080/10584587.2023.2227056
  • jurnalın adı: Integrated Ferroelectrics
  • Jurnalın baxıldığı indekslər: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Chimica, Communication Abstracts, Compendex, INSPEC, Metadex, Civil Engineering Abstracts
  • Səhifə sayı: pp.125-132
  • Açar sözlər: AFM image, conducting polymers, ellipsometry investigation, PEDOT, X-ray diffraction analysis
  • Açıq Arxiv Kolleksiyası: Məqalə
  • Adres: Yox

Qısa məlumat

In recent years, films fabricated from poly (3, 4-ethylenedioxythiophene): poly (4-styrenesulfonate) (PEDOT: PSS) aqueous dispersions have attracted lot of attention due to their exceptional advantages of high transparency in the visible range, excellent thermal stability and aqueous solution processibility. The effect of annealing on the structural, and optical properties of films obtained by the spin coating method on glass substrates has been investigated. This work investigated the impact of second annealing on the structural, and optical properties of poly (3, 4-ethylene dioxythiophene): poly (styrene sulfonate) (PEDOT: PSS) thin films. Thin films PEDOT: PSS of about 150 nm thicknesses were deposited by sol-gel method spin coating technique at room temperature. The obtained films were annealed twice: by annealing at 110 °C temperature for 15 min, and at 170 °C within one hour. The films were characterized by X-ray diffraction (XRD), spectroscopic ellipsometry (SE), photoluminescence spectroscopy, and atomic force microscopy (AFM) methods. Studies have shown that second annealing has reduced defects, efficiently.