Akademik Məlumat İdarəetmə Sistemi
Journal of Space Safety Engineering, vol.9, no.1, pp.90-95, 2022 (Scopus)
This paper summarizes reflectivity changes of pristine PTFE samples of different thicknesses irradiated with high energy electrons to the total fluence of 7.5 × 1010 electrons per square cm. Reflectivity was measured in situ with the irradiation process in JUMBO Environmental Chamber at the Spacecraft Charging and Instrumentation Calibration Laboratory (SCICL) (AFRL, Kirtland AFB, Albuquerque, NM, USA). The volume and surface resistivity measurements were recorded and calculated for test specimens using the Keithley 6517B Electrometer/High Resistance Meter system including the Keithley 8009 Resistivity Test Fixture, to measure current levels through the samples at a given voltage. System noise current was measured and averaged to be 4.83 × 10−15 Amps. The current readings were captured in Labview, 6517A Meas-Scan – I.vi. The volume and the surface resistivity of pristine PTFE both increase with increasing voltage, but not in the same proportions.