Influence of implantation of O2+ ions on the composition and electronic structure of the W(111) surface


Isakhanov Z., Umirzakov B., Nabiev D. K., Imanova G., Bekpulatov I., Khudaykulov F. Y., ...daha çox

Micro and Nano Systems Letters, vol.12, no.1, 2024 (ESCI, Scopus) identifier

  • Nəşrin Növü: Article / Letter
  • Cild: 12 Say: 1
  • Nəşr tarixi: 2024
  • Doi nömrəsi: 10.1186/s40486-024-00215-z
  • jurnalın adı: Micro and Nano Systems Letters
  • Jurnalın baxıldığı indekslər: Emerging Sources Citation Index (ESCI), Scopus
  • Açar sözlər: Band parameters, Concentration, Distribution profile, Hiding layers, Interband transitions, Ion implantation, Nanolayers, Nanosized films, Oxides
  • Açıq Arxiv Kolleksiyası: Məqalə
  • Adres: Yox

Qısa məlumat

In this paper, using high-dose implantation of O2+ ions, nano-sized WO3 films were obtained on the surface and at various depths of W(111) for the first time. It has been confirmed that when O2+ ions are implanted into W at room temperature with low energy, partial formation of oxides such as WO, WO2, WO3 and WO4 occurs. It has been proved that in order to obtain a homogeneous and good stoichiometry of W oxide, it is necessary to carry out oxidation at a certain temperature. The optimal modes for obtaining hidden oxide layers in the near-surface region of tungsten, the substrate temperature W, the energy and dose of O2+ ions were determined. The concentration profiles of distributed O atoms in depth were studied for the three-layer W-WO3-W(111) system. Using scanning electron microscopy, the formation depths and thicknesses of WO3 layers were determined. The WO3 films were polycrystalline. The resulting films have potential for creating thin-film OLED displays, as well as nanofilm MOS transistors.