Characterization of Materials

Mehrabov Ə.

  • Kursun Səviyyəsi: Doctorate
  • Dizayn edilən dərs kodu: Met E 508
  • Təhsil növü: Formal Education (Day Education)
  • Kursun Məzmunu: Theoric and Application
  • Akademik il: 2002 - 2003
  • Dərsin məzmunu:

    MIDDLE EAST TECHNICAL UNIVERSITY

    Graduate School of Natural and Applied Sciences

    Department of Metallurgical and Materials Engineering

     

     

    1. Course Code[1]

     

    METE 508

     

    1.  Course Title

     

    Characterization of Materials

     

    1. Course Category

     

     Undergraduate

     X Graduate  

     X Doctorate

     Seminar

     Laboratory

     Term Project

     M.S. Thesis

     Ph.D. Thesis

     Thesis Studies

     Summer Term Practice

     

     

     

    1. Credit

     

    Credits[2]*

    (2-2)3

     

    ECTS Credits*

    8.0

     

    Lecture Credits*

    2

     

    Laboratory Credits*

    2

     

     

    1. Catalog Description

     

    Theory behind various material characterization techniques. Transmission electron microscopy (TEM), scanning electron microscopy (SEM), advanced X-ray diffraction (XRD) techniques, atomic force microscopy (AFM). Fourier-transform infrared spectroscopy (FTIR), ultraviolet/visible spectroscopy (UV/VIS), Raman spectroscopy. Differential thermal analysis (DTA), thermogravimetric analysis (TGA), differential scanning calorimetry (DSC). Dynamic light scattering (DLS), zeta potential analysis. Vibrating-sample magnetometer (VSM), Hall effect set-up.

     

    1. Frequency

     

     Fall Semesters

     Fall/Alternate Years

     X Fall/Upon Request

    X Spring Semesters

     Spring/Alternate Years

     Spring/Upon Request

     

    1. Can be given by:

     

    Dr. Eren Kalay, Dr. Mert Efe, Dr. Batur Ercan, Dr. Amdulla Mekhrabov, Dr. Emrah Ünalan, Dr. Simge Çınar, Dr. Vedat Akdeniz

     

    1. Background Requirements(s)

     

    The students should know basics in science and engineering.

     

    1. Complementing/Overlapping Courses

     

    i) This course is intended to provide information in various characterization techniques for different classes of materials, including metals, ceramics, polymers and composites. This course does not intent to complement any other course in the Department of Metallurgical and Materials Engineering.

     

    ii) The course overlaps 40% with ‘MNT 502 Characterization Techniques at the Nanoscale’. In addition, the proposed course overlaps with some of the graduate level courses in the Department of Metallurgical and Materials Engineering. 10% overlap with ‘METE 507 Advanced Crystallography and Diffraction’ course and 10% overlap with ‘METE 535 Transmission Electron Microscopy’ course are anticipated. The total extent of the overlap with any other single course will not be more than 40%.

     

    1. Course in relation to the programs

     

    i) Proposed course is intended to fit the Graduate Program of Metallurgical and Materials Engineering. This course will be a ‘must course’ for the M.S program in the Department of Metallurgical and Materials Engineering.

     

    ii) The content of the currently offered ‘METE 508 Advanced Optical Techniques’ course was designed 20+ years ago and does not include the discoveries of the last couple of decades. To teach state-of-the-art techniques in materials characterization and to include characterization techniques appropriate for different classes of materials, including ceramics, polymers, composites and nanomaterials, faculty in the Department of Metallurgical and Materials Engineering decided to update the content of this course to include advanced XRD techniques, AFM, thermal characterization of materials, particle size analysis and electrical/magnetic characterization techniques. This proposal is intending to request change of some course content and to rename the course title to ‘Characterization of Materials’ to make it more appropriate for the revised course content.

     

    1. Course Objectives

     

    At the end of this course, the students should have an understanding in the:

     

    i) major physical, chemical and structural characterization techniques used for metallic, ceramic, polymeric and composite materials,

     

    ii) specific characterization tool and working mode for a given material depending on the specific property of interest and

     

    iii) methodology to analyze the data obtained from different characterization tools.

     

     

    1. Course Outline

     

    1- Instrumentation, working principles and imaging modes of transmission electron microscopy (TEM), selected area electron diffraction (SEAD), imaging crystal defects -- (4 weeks)

     

    2- Instrumentation, working principles and imaging modes of scanning electron microscopy (SEM) -- (2 weeks)

     

    3- Advanced X-ray diffraction techniques, high temperature and thin film XRD -- (1 week)

     

    4- Vibrational spectroscopy for molecular analysis, Fourier-transform infrared spectroscopy (FTIR), ultraviolet/visible spectroscopy (UV/VIS), Raman spectroscopy -- (2 weeks)

     

    5- Instrumentation, working principles and imaging modes of atomic force microscopy (AFM) -- (1 week)

     

    6- Particle size and surface charge analysis (dynamic light scattering, zeta potential) -- (1 week)

     

    7- Thermal characterization techniques (differential thermal analysis, differential scanning calorimetry, thermogravimetric analysis) -- (1 week)

     

    8- Electrical and magnetic analysis methods (vibrating-sample magnetometer, Hall effect set-up ) --  (1 week)

     

    9- In-class presentations -- (1 week)

     

     

    1. Textbooks

     

    Y. Lee, ‘Materials Characterization: Introduction to Microscopy and Spectroscopic Methods’, Wiley-VCH, (2013). ISBN:  978-3-527-33463-6.

     

    S. Zhang, L. Li, A. Kumar, ‘Materials Characterization Techniques’, CRC Press, (2008). ISBN: 978-1420042948.

     

     

    1. Reference Material

     

    D.B. Williams, C.B. Carter, ‘Transmission Electron Microscopy’, Springer, (2009). ISBN:  978-0378765013.

     

    J. Goldstein, D. E. Newbury, D.C. Joy, C.E. Lyman, P. Echlin, E. Lifshin, L. Sawyer, J.R. Michael, ‘Scanning Electron Microscopy and X-Ray Microanalysis’, Springer,  (2003). ISBN: 978-1461502159.

     

     

    1. Course Conduct

     

    This course consists of formal lecture series and laboratory practices.

     

    1. Grading

     

    Midterm (50% theory/50% laboratory)              30 %

    Presentation and term paper                               30 %

    Final Exam (50% theory/50% laboratory)         40 %