Temperature-dependent spectro-ellipsometric studies of optical transitions near absorption edge of TlInS2


Shim Y., Nishimoto Y., Okada W., Wakita K., MƏMMƏDOV N.

4th International Conference on Spectroscopic Ellipsometry, ICSE4, Stockholm, Sweden, 11 - 15 June 2007, vol.5, pp.1121-1124, (Full Text) identifier

  • Nəşrin Növü: Conference Paper / Full Text
  • Cild: 5
  • Doi nömrəsi: 10.1002/pssc.200777758
  • Çap olunduğu şəhər: Stockholm
  • Ölkə: Sweden
  • Səhifə sayı: pp.1121-1124
  • Açıq Arxiv Kolleksiyası: Konfrans Materialı
  • Adres: Bəli

Qısa məlumat

The temperature dependence of the absorption edge of the layered TlInS 2 was studied in a region of the incommensurate phase by spectroscopic phase modulated ellipsometry (SPME) on (001) surfaces in incoherent reflection mode that was sensitive to both E⊥C* and E//C* components of the reflected light (C*: the direction bisecting the angle between two optic axes). The energy position of the absorption edge, which was obtained from the measured Ic signal, was found to exhibit an irregular behavior with temperature in a similar way with the obtained earlier temperature dependence of excitons. It is proposed that this behaviour reflects the changes in electronic spectrum due to the temperature phase transition while the peaking anomaly of the measured in-layer-plane optical anisotropy is mostly related with the spatial structure of the incommensurate phase. © 2008 Wiley-VCH Verlag GmbH & Co. KGaA.