Transactions of Azerbaijan National Academy of Sciences., vol.32, pp.97-99, 2012 (Peer-Reviewed Journal)
Based on the analysis of experimental results of temperature dependence of contact resistance of (In-Ag-Au)-PbTe -TI- structures it has been shown that the current flow through ohmic contact in case of samples based on non-annealed crystals at temperatures below 120 K, it has been determined by field emission and at higher temperature - by thermal field emission. The basic mechanism of current flow in the contact structures of the annealed samples has been the mechanism through the shunts with metallic conductivity