RUSSIAN PHYSICS JOURNAL, vol.62, no.1, pp.114-118, 2019 (SCI-Expanded)
The paper deals with the grown tin telluride (SnTe) single crystals ?ontaining extrinsic stacking faults (SFs) and their alloyed ohmic contacts of the 57Bi-43Sn eutectic alloy in the temperature range of 77-300 K. It is found that at a low concentration, SFs decrease the hole concentration and increase the electrical resistivity of specimens when they occupy vacancies in the Sn sublattice. At a high concentration, SFs create new current carriers, thereby decreasing the specific resistance of specimens. The ohmic contact resistance is rather low, and the current flows mainly through metallic shunts.