Structural defects and electrical properties of extruded samples of Bi85Sb15 solid solutions


Samedov F., Tağıyev M.

Turkish Journal of Physics, vol.22, no.2, pp.131-138, 1998 (Scopus) identifier

  • Publication Type: Article / Article
  • Volume: 22 Issue: 2
  • Publication Date: 1998
  • Journal Name: Turkish Journal of Physics
  • Journal Indexes: Scopus, TR DİZİN (ULAKBİM)
  • Page Numbers: pp.131-138
  • Azerbaijan State University of Economics (UNEC) Affiliated: Yes

Abstract

The effect of 5 hours annealing in vacuum ∼ 10-3 Pa at 503K on the electroconductivity (σ), the coefficient of thermoelectric power (α) and the Hall coefficient (Rx) for extruded samples of Bi85Sb15 has been investigated in the temperature range from ∼ 77K up to ∼ 300K. The samples were taken with a different concentration of Pb (lead) up to ∼ 0.1a.w%. The anisotropy of electrical properties of these samples was also studied in the temperature range between 77K and 300K and in the presence of magnetic field up to ∼ 74 × 104A/m. It is established that unannealed samples are nearly insensitive to the amount of lead and to the strength of the applied magnetic field. With increasing the amount of Pb we observed inversion of signs of α and Rx from n to p-type. The obtained results are interpreted within the assumption that the extrusion of Bi85Sb15 samples may give rise to a creation of deformation defects which act as scattering centers for electrons and disappear with annealing.