Preparation and x-ray diffraction investigation of Cu1. 80-xZnTe (x= 0.025, 0.050, 0.075, 0.10 at percent) single crystals

Rzayev, RÖVNƏQ; Gasymov, H; Mamedov, H

Preparation and x-ray diffraction investigation of Cu1. 80-xZnTe (x= 0.025, 0.050, 0.075, 0.10 at percent) single crystals

Journal of Radiation Researches, vol.5, no.2, pp.128-132, 2018 (Peer-Reviewed Journal)

Nəşrin Növü: Article / Article
Cild: 5 Say: 2
Nəşr tarixi: 2018
jurnalın adı: Journal of Radiation Researches
Səhifə sayı: pp.128-132
Açıq Arxiv Kolleksiyası: Məqalə
Adres: Bəli

Qısa məlumat

In the presented study, it was reviewed preparing of the Cu1.80-xZnTe monocrystal systems (x =0.025, 0.050, 0.075, 0.10 at.percent), affection to crystal cage parameters and phase transition temperature of concentration increase of substituting isovalent metal atoms (Zn2+) in crystalline form Cu1.80Te (so, the increase in the value of x).